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Book Chapters

1. Kurtis Cantley, Anand Subramaniam, and Eric Vogel, "Spike Timing-Dependent Synaptic Plasticity Using Memristors and Nano-Crystalline Silicon TFT Memories," in Nanoelectronic Device Applications Handbook, ed. James E. Morris & Krzysztof Iniewski, CRC Press (Taylor & Francis Group), 335-345 (2013).

2. M. Milojevic, C. L.Hinkle, E. M. Vogel and R. M.Wallace, “Interfacial Chemistry of oxides on III-V Compound Semiconductors,” in  Fundamentals of Compound Semiconductor MOSFETs, ed. P. Ye and  S. Oktyabrsky, Springer, 131-172 (2010).

3. Eric M. Vogel, “Technology and Metrology of New Electronic Materials and Devices,” in Nanoscience and Technology: A Collection of Reviews from Nature Journals, ed. Peter Rodgers, Nature Publishing Group, 166-173 (2009).

4. C. R. Cleavelin, L. Columbo, H. Niimi, S. Pas, and E. M. Vogel, “Oxidation and Gate Dielectrics in Handbook of Semiconductor Manufacturing Technology, 2nd edition, ed. Y. Nishi and R. Doering, Taylor and Francis Group, 9:1-37 (2007).

5. E. M. Vogel, and V. Misra, “MOS Device Characterization,” in Handbook of Silicon Semiconductor Metrology, ed. A. C. Diebold, Marcel-Dekker, 59-96 (2001).

6. C. R. Cleavelin, S. Pas, E. M. Vogel, and J. J. Wortman, “Oxidation,” in Handbook of Semiconductor Manufacturing Technology, ed. Y. Nishi and R. Doering, CRC Press, 163-185 (2000).